In this paper, the mechanisms for stability in ENODe devices are investigated. In this work the mechanisms leading to state loss and cycling instability in redox-gated neuromorphic devices are revealed: parasitic redox reactions and out-diffusion of reducing additives. The results of this study are used to design an encapsulation structure which shows an order of magnitude improvement in state retention and cycling stability.
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Yoeri elected as associate editor for Materials Science and Engineering R
Yoeri was selected to serve on the editorial board for the journal Materials Science and Engineering R: sciencedirect.com/journal/materials-science-and-engineering-r-reports Materials Science and Engineering R publishes the full spectrum of materials science and engineering. The journal aims Read more…
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